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An O/E measurement probe based on an optics-extended MCM-D motherboard technology
Publication:
An O/E measurement probe based on an optics-extended MCM-D motherboard technology
Date
2002
Proceedings Paper
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6458.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Pauw, Herbert
;
De Baets, Johan
;
Vanfleteren, Jan
;
Van Calster, Andre
Journal
Abstract
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1929
since deposited on 2021-10-14
Acq. date: 2025-10-26
Citations
Metrics
Views
1929
since deposited on 2021-10-14
Acq. date: 2025-10-26
Citations