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Reduction of surface metallic contamination through optimized rinsing and single-wafer drying
Publication:
Reduction of surface metallic contamination through optimized rinsing and single-wafer drying
Date
2002
Proceedings Paper
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6009.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fyen, Wim
;
Holsteyns, Frank
;
Lauerhaas, Jeff
;
Bearda, Twan
;
Mertens, Paul
;
Heyns, Marc
Journal
Abstract
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1953
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1953
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations