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Defect generation in ultrathin SiON/ZrO2 gate dielectric stacks
Publication:
Defect generation in ultrathin SiON/ZrO2 gate dielectric stacks
Date
2002
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, M.
;
Autran, J.L.
;
Afanasiev, Valeri
;
Stesmans, Andre
;
Heyns, Marc
Journal
Journal of the Electrochemical Society
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1923
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1923
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations