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Observation of hot-carrier-induced nFET gate oxide breakdown in dynamically stressed CMOS circuits
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Authors
Kaczer, Ben
;
Crupi, Felice
;
Degraeve, Robin
;
Roussel, Philippe
;
Ciofi, Ivan
;
Groeseneken, Guido
Conference
IEDM Technical Digest
Title
Observation of hot-carrier-induced nFET gate oxide breakdown in dynamically stressed CMOS circuits
Publication type
Proceedings paper
Embargo date
9999-12-31
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