Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Articles
View item
imec Publications Repository
imec Publications
Articles
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices
View/
open
6402.pdf (411.2Kb)
Metadata
Show full item record
Authors
Nicolett, A.S.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
Issue
9
Journal
Solid-State Electronics
Volume
46
Title
Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices
Publication type
Journal article
Embargo date
9999-12-31
Collections
Articles
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login