Authors

Ohyama, Hidenori; Hirao, T.; Simoen, Eddy; Claeys, Cor; Nakabayashi, M.; Onoda, S.

Conference

GADEST 2001 - Proceedings of the 9th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology;

Title

Radiation damage in npn Si transistors due to high-temperature gamma-ray and 1-MeV electron irradiation

Publication type

Proceedings paper