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Articles
A model study of the hot-carrier problem in LDD and overlapped LDD MOSFETs
Publication:
A model study of the hot-carrier problem in LDD and overlapped LDD MOSFETs
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Date
1995
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Habas, Predrag
;
Bellens, Rudi
;
Groeseneken, Guido
Journal
Microelectronic Engineering
Abstract
Description
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2057
since deposited on 2021-09-29
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last week
Acq. date: 2025-12-11
Citations
Metrics
Views
2057
since deposited on 2021-09-29
4
last month
2
last week
Acq. date: 2025-12-11
Citations