Publication:
Characterization of hot-carrier aging of a 0.35µm fully overlapped-LDD CMOS technology
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2002 since deposited on 2021-09-29
2last month
Acq. date: 2026-01-09
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Metrics
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2002 since deposited on 2021-09-29
2last month
Acq. date: 2026-01-09
Citations