dc.contributor.author | Habas, Predrag | |
dc.contributor.author | Bellens, Rudi | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Van den bosch, G. | |
dc.contributor.author | Deferm, Ludo | |
dc.date.accessioned | 2021-09-29T13:07:04Z | |
dc.date.available | 2021-09-29T13:07:04Z | |
dc.date.issued | 1995 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/668 | |
dc.source | IIOimport | |
dc.title | Characterization of hot-carrier aging of a 0.35µm fully overlapped-LDD CMOS technology | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Deferm, Ludo | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 197 | |
dc.source.endpage | 202 | |
dc.source.conference | 20th International Conference on Microelectronics. Proceedings | |
dc.source.conferencedate | 12/09/1995 | |
dc.source.conferencelocation | Nis Serbia | |
imec.availability | Published - imec | |