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Printability of hard and soft defects in 193-nm lithography
Publication:
Printability of hard and soft defects in 193-nm lithography
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Date
2002
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Philipsen, Vicky
;
Jonckheere, Rik
;
Kohlpoth, Stephanie
;
Friedrich, Christoph M.
;
Torres, Juan Andres
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1899
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Acq. date: 2025-12-12
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Metrics
Views
1899
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-12
Citations