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Meyer-Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?

dc.contributor.authorPichon, L.
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorRoutoure, J. M.
dc.contributor.authorCarin, R.
dc.contributor.authorBonnaud, O.
dc.contributor.authorMohammed-Brahim, T.
dc.date.accessioned2021-10-14T22:47:53Z
dc.date.available2021-10-14T22:47:53Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6721
dc.sourceIIOimport
dc.titleMeyer-Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?
dc.typeOral presentation
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.source.peerreviewno
dc.source.conferenceE-MRS Spring Meeting Symposium K: Thin Film Materials for Large-Area Electronics
dc.source.conferencedate18/06/2002
dc.source.conferencelocationStrasbourg France
imec.availabilityPublished - imec


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