Physical failure analysis to distinguish EOS and ESD failures
dc.contributor.author | Tung, Chih Hang | |
dc.contributor.author | Cheng, Cheng Kou | |
dc.contributor.author | Radhakrishnan, M.K. | |
dc.contributor.author | Mahadeva Iyer, Natarajan | |
dc.date.accessioned | 2021-10-14T23:25:27Z | |
dc.date.available | 2021-10-14T23:25:27Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6896 | |
dc.source | IIOimport | |
dc.title | Physical failure analysis to distinguish EOS and ESD failures | |
dc.type | Proceedings paper | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 65 | |
dc.source.endpage | 69 | |
dc.source.conference | Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA | |
dc.source.conferencedate | 8/07/2002 | |
dc.source.conferencelocation | Signapore | |
imec.availability | Published - open access |