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Physical failure analysis to distinguish EOS and ESD failures

dc.contributor.authorTung, Chih Hang
dc.contributor.authorCheng, Cheng Kou
dc.contributor.authorRadhakrishnan, M.K.
dc.contributor.authorMahadeva Iyer, Natarajan
dc.date.accessioned2021-10-14T23:25:27Z
dc.date.available2021-10-14T23:25:27Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6896
dc.sourceIIOimport
dc.titlePhysical failure analysis to distinguish EOS and ESD failures
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage65
dc.source.endpage69
dc.source.conferenceProceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA
dc.source.conferencedate8/07/2002
dc.source.conferencelocationSignapore
imec.availabilityPublished - open access


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