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Articles
Three-dimensional carrier profiling of InP-based devices using scanning spreading resistance microscopy
Publication:
Three-dimensional carrier profiling of InP-based devices using scanning spreading resistance microscopy
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Date
2002
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Xu, Mingwei
;
Hantschel, Thomas
;
Vandervorst, Wilfried
Journal
Applied Physics Letters
Abstract
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1846
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Acq. date: 2025-12-17
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Views
1846
since deposited on 2021-10-15
2
last month
1
last week
Acq. date: 2025-12-17
Citations