Publication:
Constant voltage stress induced degradation in HfO2/SiO2 gate dielectric stacks
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1956 since deposited on 2021-10-15
1last month
1last week
Acq. date: 2026-01-11
Citations
Metrics
Views
1956 since deposited on 2021-10-15
1last month
1last week
Acq. date: 2026-01-11
Citations