Publication:
Polarity effect on the temperature dependence of leakage current through HfO2/SiO2 gate dielectric stacks
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1946 since deposited on 2021-10-15
4last month
3last week
Acq. date: 2026-09-15
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Statistics
Views
1946 since deposited on 2021-10-15
4last month
3last week
Acq. date: 2026-09-15
Citations