Publication:
Polarity effect on the temperature dependence of leakage current through HfO2/SiO2 gate dielectric stacks
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1941 since deposited on 2021-10-15
2last month
Acq. date: 2026-05-16
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Statistics
Views
1941 since deposited on 2021-10-15
2last month
Acq. date: 2026-05-16
Citations