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Gate-level characterization and reduction of substrate noise in integrated digital circuits
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Authors
Badaroglu, Mustafa
;
Wambacq, Piet
;
Van der Plas, Geert
;
Donnay, Stephane
;
Gielen, Georges
;
De Man, Hugo
Conference
1st Flanders Engineering PhD Symposium
Title
Gate-level characterization and reduction of substrate noise in integrated digital circuits
Publication type
Proceedings paper
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