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Conference contributions
Gate-level characterization and reduction of substrate noise in integrated digital circuits
Publication:
Gate-level characterization and reduction of substrate noise in integrated digital circuits
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Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Badaroglu, Mustafa
;
Wambacq, Piet
;
Van der Plas, Geert
;
Donnay, Stephane
;
Gielen, Georges
;
De Man, Hugo
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1932
since deposited on 2021-10-15
2
last month
Acq. date: 2026-02-25
Citations
Statistics
Views
1932
since deposited on 2021-10-15
2
last month
Acq. date: 2026-02-25
Citations