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Focused ion beam sample preparation: applications in materials science
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Authors
Bender, Hugo
;
Benedetti, Alessandro
;
Richard, Olivier
;
Van Marcke, Patricia
;
Drijbooms, Chris
Conference
Microscopies in Mediterranean Area, 8th Congress of the French Society of Microscopie - MiMeA
Title
Focused ion beam sample preparation: applications in materials science
Publication type
Oral presentation
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