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Focused ion beam sample preparation: applications in materials science

dc.contributor.authorBender, Hugo
dc.contributor.authorBenedetti, Alessandro
dc.contributor.authorRichard, Olivier
dc.contributor.authorVan Marcke, Patricia
dc.contributor.authorDrijbooms, Chris
dc.date.accessioned2021-10-15T04:00:36Z
dc.date.available2021-10-15T04:00:36Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7194
dc.sourceIIOimport
dc.titleFocused ion beam sample preparation: applications in materials science
dc.typeOral presentation
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorVan Marcke, Patricia
dc.contributor.imecauthorDrijbooms, Chris
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.source.peerreviewno
dc.source.conferenceMicroscopies in Mediterranean Area, 8th Congress of the French Society of Microscopie - MiMeA
dc.source.conferencedate23/06/2003
dc.source.conferencelocationToulon France
imec.availabilityPublished - imec


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