Publication:

Correlation between charge Injection and trapping in SiO2/HfO2 gate stacks

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1981 since deposited on 2021-10-15
Acq. date: 2026-07-16

Citations

Statistics

Views

1981 since deposited on 2021-10-15
Acq. date: 2026-07-16

Citations