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Correlation between charge Injection and trapping in SiO2/HfO2 gate stacks
Publication:
Correlation between charge Injection and trapping in SiO2/HfO2 gate stacks
Date
2003
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cartier, Eduard
;
Pantisano, Luigi
;
Kerber, Andreas
;
Groeseneken, Guido
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1973
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations
Metrics
Views
1973
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations