Correlation between charge Injection and trapping in SiO2/HfO2 gate stacks

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Authors
Cartier, Eduard; Pantisano, Luigi; Kerber, Andreas; Groeseneken, Guido
Conference
Insulating Films on Semiconductors Conference - INFOS. 13th Bi-Annual Conference
Title
Correlation between charge Injection and trapping in SiO2/HfO2 gate stacks
Publication type
Oral presentation
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