Publication:

The influence of packaging materials on RF performance

Date

2003
Journal article
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Author(s)

Chandrasekhar, Arun
;
Brebels, Steven  
;
Stoukatch, Serguei
;
Beyne, Eric  
;
De Raedt, Walter  
;
Nauwelaers, Bart  

Journal

Microelectronics Reliability

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1808 since deposited on 2021-10-15
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