Authors

Crupi, F.; Kaczer, Ben; Degraeve, Robin; De Keersgieter, An; Groeseneken, Guido

Issue

1

Journal

IEEE Trans. Device and Materials Reliability

Volume

3

Title

A comparative study of the oxide breakdown in short-channel nMOSFETs and pMOSFETs stressed in inversion and in accumulation regimes

Publication type

Journal article

Embargo date

9999-12-31