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Zn channeled implantation in GaN: damages investigated by using high resolution XTEM and channeling RBS
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Authors
Ding, F.R.
;
He, W.
;
Vantomme, Andre
;
Zhao, Q.
;
Pipeleers, B.
;
Jacobs, K.
;
Moerman, Ingrid
Issue
1
Journal
Materials Science and Engineering B
Volume
98
Title
Zn channeled implantation in GaN: damages investigated by using high resolution XTEM and channeling RBS
Publication type
Journal article
Embargo date
9999-12-31
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