Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Characterization of vertical RESURF diodes using scanning probe microscopy
Publication:
Characterization of vertical RESURF diodes using scanning probe microscopy
Date
2003
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Duhayon, Natasja
;
Xu, Mingwei
;
Vandervorst, Wilfried
;
Hellemans, L.
;
Rochefort, Christelle
;
Van Dalen, Rob
Journal
Materials Science and Engineering B
Abstract
Description
Metrics
Views
1964
since deposited on 2021-10-15
421
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1964
since deposited on 2021-10-15
421
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations