Publication:

Gate oxide atomic layer deposition studied by in situ infrared spectroscopy

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1920 since deposited on 2021-10-15
1last month
Acq. date: 2026-05-19

Citations

Statistics

Views

1920 since deposited on 2021-10-15
1last month
Acq. date: 2026-05-19

Citations