Publication:

Characterization of the Vt-instability un SiO2 HFO2 gate dielectrics

Date

2003

Proceedings Paper

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Author(s)

Kerber, Andreas

;

;

Pantisano, Luigi

;

Rosmeulen, Maarten

;

Degraeve, Robin

;

Kauerauf, Thomas

;

Groeseneken, Guido

;

;

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1942 since deposited on 2021-10-15

Acq. date: 2026-04-26