Publication:
Characterization of the Vt-instability un SiO2 HFO2 gate dielectrics
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1937 since deposited on 2021-10-15
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Acq. date: 2026-01-11
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1937 since deposited on 2021-10-15
1last month
1last week
Acq. date: 2026-01-11
Citations