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A detailed experimental investigation of impact ionization in n-channel metal-oxide-semiconductor field-effect-transistors at very low drain voltages
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Authors
Kottantharayil, Anil
;
Mahapatra, S.
;
Eisele, I.
Issue
6
Journal
Solid-State Electronics
Volume
47
Title
A detailed experimental investigation of impact ionization in n-channel metal-oxide-semiconductor field-effect-transistors at very low drain voltages
Publication type
Journal article
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