Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETs

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Authors

Ohyama, H.; Hayama, K.; Takakura, K.; Jono, T.; Simoen, Eddy; Claeys, Cor

Issue

1_4

Journal

Microelectronic Engineering

Volume

66

Title

Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETs

Publication type

Journal article

Embargo date

9999-12-31

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