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Analysis of the early-failure rate prediction of time-dependent dielectric breakdown in thin oxides

dc.contributor.authorOgier, Jean-Luc
dc.contributor.authorDegraeve, Robin
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T13:12:52Z
dc.date.available2021-09-29T13:12:52Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/793
dc.sourceIIOimport
dc.titleAnalysis of the early-failure rate prediction of time-dependent dielectric breakdown in thin oxides
dc.typeProceedings paper
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage299
dc.source.endpage302
dc.source.conference25th European Solid State Device Research Conference - ESSDERC
dc.source.conferencedate25/09/1995
dc.source.conferencelocationDen Haag The Netherlands
imec.availabilityPublished - open access


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