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Perfectly matched layers in semi-analytical techniques

dc.contributor.authorOlyslager, Frank
dc.contributor.authorDerudder, Henk
dc.contributor.authorDe Zutter, Daniel
dc.contributor.authorRogier, Henk
dc.contributor.authorPissoort, Davy
dc.contributor.authorVande Ginste, Dries
dc.contributor.authorBienstman, Peter
dc.contributor.authorKnockaert, Luc
dc.date.accessioned2021-10-15T05:55:44Z
dc.date.available2021-10-15T05:55:44Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7953
dc.sourceIIOimport
dc.titlePerfectly matched layers in semi-analytical techniques
dc.typeOral presentation
dc.contributor.imecauthorDe Zutter, Daniel
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.imecauthorBienstman, Peter
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.contributor.orcidimecBienstman, Peter::0000-0001-6259-464X
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceWorkshop on Advanced Computational Electromagnetics
dc.source.conferencedate26/05/2003
dc.source.conferencelocationHet Pand, Ghent Belgium
imec.availabilityPublished - open access
imec.internalnotesSlides overview


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