Authors

Claeys, Cor; Simoen, Eddy; Lukyanchikova, N.; Petrichuk, M.; Garbar, N.

Conference

1st ELEN Workshop on Noise in Electronic Systems

Title

Interface trap related generation-recombination noise in submicron buried-channel SOI pMOSFETs

Publication type

Oral presentation

Embargo date

9999-12-31