Publication:
Interface trap related generation-recombination noise in submicron buried-channel SOI pMOSFETs
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33314 since deposited on 2021-09-29
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Acq. date: 2025-12-18
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Views
33314 since deposited on 2021-09-29
1last month
1last week
Acq. date: 2025-12-18
Citations