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Creating spectrally pure signals for ADC-testing

dc.contributor.authorRabijns, D.
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorVan Moer, W.
dc.contributor.authorRolain, Y.
dc.contributor.authorSchoukens, J.
dc.date.accessioned2021-10-15T06:18:04Z
dc.date.available2021-10-15T06:18:04Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8051
dc.sourceIIOimport
dc.titleCreating spectrally pure signals for ADC-testing
dc.typeProceedings paper
dc.contributor.imecauthorVandersteen, Gerd
dc.source.peerreviewno
dc.source.beginpage614
dc.source.endpage618
dc.source.conferenceProceedings of the 20th IEEE Instrumentation and Measurement Technology Conference - IMTC
dc.source.conferencedate20/03/2003
dc.source.conferencelocationVail, CO USA
imec.availabilityPublished - imec


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