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Strain determination in silicon microstructures by combined convergent beam electron diffraction, process simulation, and micro-Raman spectroscopy
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Strain determination in silicon microstructures by combined convergent beam electron diffraction, process simulation, and micro-Raman spectroscopy
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Date
2003
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Senez, V.
;
Armigliato, A.
;
De Wolf, Ingrid
;
Carnevale, G.
;
Balboni, R.
;
Frabboni, S.
;
Benedetti, Alessandro
Journal
Journal of Applied Physics
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1936
since deposited on 2021-10-15
1
last month
Acq. date: 2026-01-09
Citations
Metrics
Views
1936
since deposited on 2021-10-15
1
last month
Acq. date: 2026-01-09
Citations