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Conference contributions
Noise diagnostics of advanced silicon substrates and deep submicron process modules
Publication:
Noise diagnostics of advanced silicon substrates and deep submicron process modules
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Date
2003
Proceedings Paper
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7277.pdf
1.08 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Mercha, Abdelkarim
;
Claeys, Cor
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1894
since deposited on 2021-10-15
Acq. date: 2026-01-08
Citations
Metrics
Views
1894
since deposited on 2021-10-15
Acq. date: 2026-01-08
Citations