Publication:
Impact of the back-gate bias on the low-frequency noise of fully depleted silicon-on-insulator MOSFETs
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1884 since deposited on 2021-10-15
2last month
Acq. date: 2026-04-06
Citations
Statistics
Views
1884 since deposited on 2021-10-15
2last month
Acq. date: 2026-04-06
Citations