Authors

Ulyashin, A.; Bilyalov, Renat; Bruck, A.; Scherff, M.; Job, R.; Fahrner, W.; Poortmans, Jef

Conference

10th Int. Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology - GADEST

Title

Minority carrier lifetime improvement in p-type silicon by oxygen related centers gettering at low temperatures: application to the heterojunction solar cell processing

Publication type

Oral presentation