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Characterization and modeling of transient device behavior under CDM ESD stress

dc.contributor.authorWillemen, J.
dc.contributor.authorAndreini, A.
dc.contributor.authorDe Heyn, Vincent
dc.contributor.authorEsmark, K.
dc.contributor.authorEtherton, M.
dc.contributor.authorGieser, H.
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMettler, S.
dc.contributor.authorMorena, E.
dc.contributor.authorQu, S.
dc.contributor.authorSoppa, W.
dc.contributor.authorStadler, W.
dc.contributor.authorStella, R.
dc.contributor.authorWilkening, W.
dc.contributor.authorWolf, H.
dc.contributor.authorZullino, L.
dc.date.accessioned2021-10-15T07:48:26Z
dc.date.available2021-10-15T07:48:26Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8401
dc.sourceIIOimport
dc.titleCharacterization and modeling of transient device behavior under CDM ESD stress
dc.typeProceedings paper
dc.contributor.imecauthorDe Heyn, Vincent
dc.contributor.imecauthorGroeseneken, Guido
dc.source.peerreviewno
dc.source.beginpage88
dc.source.endpage97
dc.source.conferenceProceedings 25th EOS/ESD Symposium
dc.source.conferencedate21/09/2003
dc.source.conferencelocationLas Vegas, NV USA
imec.availabilityPublished - imec


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