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The impact of Fe and Cu on the minority carrier lifetime of P and N-type silicon wafers

dc.contributor.authorRotondaro, Antonio
dc.contributor.authorHurd, Trace
dc.contributor.authorKaniava, Arvydas
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorHeyns, Marc
dc.contributor.authorClaeys, Cor
dc.contributor.authorBrown, G.
dc.date.accessioned2021-09-29T13:15:58Z
dc.date.available2021-09-29T13:15:58Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/841
dc.sourceIIOimport
dc.titleThe impact of Fe and Cu on the minority carrier lifetime of P and N-type silicon wafers
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage54
dc.source.endpage63
dc.source.conferenceALTECH 95: Analytical Techniques for Semiconductor Materials and Process Characterization II. Proceedings of the Satellite Sympo
dc.source.conferencedate28/09/1995
dc.source.conferencelocationDen Haag The Netherlands
imec.availabilityPublished - open access
imec.internalnotesElectrochemical Society Proceedings; Vol. 95-30


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