Authors

Biesemans, L.; Schepers, K.; Vanstreels, Kris; D'Haen, Jan; De Ceuninck, Ward; D'Olieslaeger, Marc

Conference

Proceedings of the 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF

Title

MTF test system with AC based dynamic joule correction for electromigration tests on interconnects

Publication type

Proceedings paper