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Reliability investigation of a source side injection local charge trapping device
Publication:
Reliability investigation of a source side injection local charge trapping device
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Breuil, Laurent
;
Haspeslagh, Luc
;
Blomme, Pieter
;
Lorenzini, Martino
;
Wellekens, Dirk
;
De Vos, Joeri
;
Van Houdt, Jan
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1912
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Acq. date: 2026-01-11
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Views
1912
since deposited on 2021-10-15
2
last month
Acq. date: 2026-01-11
Citations