Reliability investigation of a source side injection local charge trapping device

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Authors
Breuil, Laurent; Haspeslagh, Luc; Blomme, Pieter; Lorenzini, Martino; Wellekens, Dirk; De Vos, Joeri; Van Houdt, Jan
Conference
20th IEEE Non-Volatile Semiconductor Memory Workshop - NVSMW
Title
Reliability investigation of a source side injection local charge trapping device
Publication type
Oral presentation
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