Authors

David, M.L.; Simoen, Eddy; Claeys, Cor; Neimash, V.; Kras'ko, M.; Kraitchinski, A.; Voytovych, V.; Kabaldin, A.; Barbot, J.F.

Conference

Workshop on Defects Relevant to Engineering Advanced Silicon-Based Devices

Title

Electrically active defects in irradiated n-Type Czochralski silicon doped with group IV impurities

Publication type

Oral presentation