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Initial assessment of the impact of a hard pellicle on imaging using a 193 nm step-and-scan system
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Authors
De Bisschop, Peter
;
Kocsis, Michael
;
Bruls, R.
;
Van Peski, C.
;
Grenville, A.
Issue
2
Journal
Journal of Microlithography, Microfabrication and Microsystems
Volume
3
Title
Initial assessment of the impact of a hard pellicle on imaging using a 193 nm step-and-scan system
Publication type
Journal article
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