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Characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy
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Authors
De Gryse, O.
;
Clauws, P.
;
Vanhellemont, Jan
;
Lebedev, O.I.
;
Van Landuyt, J.
;
Simoen, Eddy
;
Claeys, Cor
Issue
9
Journal
Journal of the Electrochemical Society
Volume
151
Title
Characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy
Publication type
Journal article
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