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Low-Frequency Noise Assessment of Hot Carrier Degradation Effects in Poly-Emitter Bipolar Transistors

dc.contributor.authorSimoen, Eddy
dc.contributor.authorMerron, B.
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-09-29T13:16:48Z
dc.date.available2021-09-29T13:16:48Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/882
dc.sourceIIOimport
dc.titleLow-Frequency Noise Assessment of Hot Carrier Degradation Effects in Poly-Emitter Bipolar Transistors
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.conference2nd ELEN Workshop; October 25-27, 1995; Grenoble, France.
dc.source.conferencelocation
imec.availabilityPublished - imec


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