dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Merron, B. | |
dc.contributor.author | Decoutere, Stefaan | |
dc.date.accessioned | 2021-09-29T13:16:48Z | |
dc.date.available | 2021-09-29T13:16:48Z | |
dc.date.issued | 1995 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/882 | |
dc.source | IIOimport | |
dc.title | Low-Frequency Noise Assessment of Hot Carrier Degradation Effects in Poly-Emitter Bipolar Transistors | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Decoutere, Stefaan | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
dc.source.peerreview | no | |
dc.source.conference | 2nd ELEN Workshop; October 25-27, 1995; Grenoble, France. | |
dc.source.conferencelocation | | |
imec.availability | Published - imec | |