Publication:
Low-Frequency Noise Assessment of Hot Carrier Degradation Effects in Poly-Emitter Bipolar Transistors
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2065 since deposited on 2021-09-29
2last month
Acq. date: 2026-02-24
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Statistics
Views
2065 since deposited on 2021-09-29
2last month
Acq. date: 2026-02-24
Citations