Publication:
Low-Frequency Noise Assessment of Hot Carrier Degradation Effects in Poly-Emitter Bipolar Transistors
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2063 since deposited on 2021-09-29
1last month
Acq. date: 2025-12-12
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Views
2063 since deposited on 2021-09-29
1last month
Acq. date: 2025-12-12
Citations