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Low-Frequency Noise Assessment of Hot Carrier Degradation Effects in Poly-Emitter Bipolar Transistors

Date

1995
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorMerron, B.
dc.contributor.authorDecoutere, Stefaan
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2021-09-29T13:16:48Z
dc.date.available2021-09-29T13:16:48Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/882
dc.source.conference2nd ELEN Workshop; October 25-27, 1995; Grenoble, France.
dc.source.conferencelocation
dc.title

Low-Frequency Noise Assessment of Hot Carrier Degradation Effects in Poly-Emitter Bipolar Transistors

dc.typeOral presentation
dspace.entity.typePublication
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