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A low-frequency noise study of state-of-the-art silicon n+p junction diodes
Publication:
A low-frequency noise study of state-of-the-art silicon n+p junction diodes
Date
1995
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Vanhellemont, Jan
;
Claeys, Cor
;
Bosman, Gijs
Journal
Abstract
Description
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1999
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1999
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations