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A low-frequency noise study of state-of-the-art silicon n+p junction diodes

dc.contributor.authorSimoen, Eddy
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorClaeys, Cor
dc.contributor.authorBosman, Gijs
dc.date.accessioned2021-09-29T13:16:49Z
dc.date.available2021-09-29T13:16:49Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/883
dc.sourceIIOimport
dc.titleA low-frequency noise study of state-of-the-art silicon n+p junction diodes
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage537
dc.source.endpage540
dc.source.conferenceNoise in Physical Systems and 1/f Fluctuations - ICNF. Proceedings of the 13th International Conference
dc.source.conferencedate29/05/1995
dc.source.conferencelocationPalanga Lithuania
imec.availabilityPublished - open access


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