Publication:
Defect analysis of strained silicon on thin strain-relaxed buffer layers for high mobility Transistors
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1989 since deposited on 2021-10-15
1last month
Acq. date: 2026-02-27
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Statistics
Views
1989 since deposited on 2021-10-15
1last month
Acq. date: 2026-02-27
Citations