Bias stress in pentacene transistors measured by four probe transistor structures

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Authors
Genoe, Jan; Steudel, Soeren; De Vusser, Stijn; Verlaak, Stijn; Janssen, Dimitri; Heremans, Paul
Conference
Proceedings of the 34th European Solid-State Device Research Conference - ESSDERC
Title
Bias stress in pentacene transistors measured by four probe transistor structures
Publication type
Proceedings paper
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