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Bias stress in pentacene transistors measured by four probe transistor structures
Publication:
Bias stress in pentacene transistors measured by four probe transistor structures
Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Genoe, Jan
;
Steudel, Soeren
;
De Vusser, Stijn
;
Verlaak, Stijn
;
Janssen, Dimitri
;
Heremans, Paul
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1923
since deposited on 2021-10-15
Acq. date: 2025-10-27
Citations
Metrics
Views
1923
since deposited on 2021-10-15
Acq. date: 2025-10-27
Citations